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Chen and Jain receive best paper award

Chen and Jain receive best paper award

Yi Chen (PhD '07) and Anil Jain, University Distinguished Professor of Computer Science and Engineering, received Best Paper Award at the 3rd International Association of Pattern Recognition / IEEE International Conference on Biometrics (ICB 2009).

Their paper is titled "Beyond Minutiae: A Fingerprint Individuality Model with Pattern, Ridge and Pore Features."

ICB 2009 is the premier scientific conference devoted to the study of Biometric Authentication and Identification technologies.

Read Beyond Minutiae: [PDF]

(Date Posted: 2009-06-09)